Atomic Force Microscope (Model No. NTEGRA Vita from NT-MDT).:

Atomic Force Microscope (AFM) or scanning probe microscope (SPM) is an advanced highresolution microscope consisting of cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The main advantage of atomic force microscope is that the sample need not be conducting.


  • Surface morphology of physical and biological samples.
  • Surface mapping of magnetic material.
  • Current mapping.
  • NanoLithography.
  • Nanoindentation.
  • STM.