X-ray diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material. Both powder as well as thin film samples can be analysed.
XRD equipment at IASST:
Model: D8 Advance, Manufacturer: Bruker AXS, Germany
- Phase identification of powder samples.
- Phase identification of thin films.
- Crystallite size determination.
- Grazing incidence XRD
- X-ray reflectivity analysis
With specialized techniques, XRD can be used to:
- determine crystal structures using Rietveld refinement.
- determine of modal amounts of minerals (quantitative analysis).
- characterize thin films samples by:
- determining dislocation density and quality of the film by rocking curve measurements
- measuring superlattices in multilayered epitaxial structures
- determining the thickness, roughness and density of the film using glancing incidence X-ray reflectivity measurements.
- make textural measurements, such as the orientation of grains, in a polycrystalline sample.