Scanning Electron Microscope (SEM):

Scanning Electron Microscope (SEM) is an electron microscope which scans a focused electronbeam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.

Model at IASST : Zeiss Ʃigma VP.

Applications:

  • Image morphology of samples.
  • Topographical, morphological, compositional and crystalline information of different material.